Print Email Facebook Twitter Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: Erratum Title Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: Erratum Author Adam, A.J.L. Brok, J.M. Seo, M.A. Ahn, K.J. Kim, D.S. Kang, J.H. Park, Q.H. Nagel, M. Planken, P.C.M. Faculty Applied Sciences Department Imaging Science and Technology Date 2008-12-19 Abstract An erratum is presented to correct an error in the discussion section of [Opt. Express. 16, 7407-7417 (2008)] and to add a relevant reference on earlier work. Subject aperturesnear-field microscopyspectroscopyteraherz To reference this document use: http://resolver.tudelft.nl/uuid:0d005f8c-f2b8-466a-8c59-ff520f66db62 DOI https://doi.org/10.1364/OE.16.008054 Publisher Optical Society of America ISSN 1094-4087 Source http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-11-8054 Source Optics Express, 16 (11), 2008 Part of collection Institutional Repository Document type journal article Rights (c) 2008 Optical Society of America Files PDF Adam2-2008.pdf 33.44 KB Close viewer /islandora/object/uuid:0d005f8c-f2b8-466a-8c59-ff520f66db62/datastream/OBJ/view