Print Email Facebook Twitter Lateral position correction in ptychography using the gradient of intensity patterns Title Lateral position correction in ptychography using the gradient of intensity patterns Author Dwivedi, P. (TU Delft ImPhys/Optics) Konijnenberg, A.P. (TU Delft ImPhys/Optics) Pereira, S.F. (TU Delft ImPhys/Optics) Urbach, Paul (TU Delft ImPhys/Optics) Date 2018 Abstract Ptychography, a form of Coherent Diffractive Imaging, is used with short wavelengths (e.g. X-rays, electron beams) to achieve high-resolution image reconstructions. One of the limiting factors for the reconstruction quality is the accurate knowledge of the illumination probe positions. Recently, many advances have been made to relax the requirement for the probe positions accuracy. Here, we analyse and demonstrate a straightforward approach that can be used to correct the probe positions with sub-pixel accuracy. Simulations and experimental results with visible light are presented in this work. To reference this document use: http://resolver.tudelft.nl/uuid:13d0a4e3-cb95-484d-aedb-e4b08ea19217 DOI https://doi.org/10.1016/j.ultramic.2018.04.004 ISSN 0304-3991 Source Ultramicroscopy, 192, 29-36 Part of collection Institutional Repository Document type journal article Rights © 2018 P. Dwivedi, A.P. Konijnenberg, S.F. Pereira, Paul Urbach Files PDF PDwivedi_revision2.pdf 1.95 MB Close viewer /islandora/object/uuid:13d0a4e3-cb95-484d-aedb-e4b08ea19217/datastream/OBJ/view