Print Email Facebook Twitter Quantifying amplitude reduction mechanism in Tapping Mode Atomic Force Microscopy Title Quantifying amplitude reduction mechanism in Tapping Mode Atomic Force Microscopy Author Keyvani, A. (TNO) Sadeghian, H. (TNO) Goosen, J.F.L. (TU Delft Computational Design and Mechanics) van Keulen, A. (TU Delft Computational Design and Mechanics) Date 2016 To reference this document use: http://resolver.tudelft.nl/uuid:13dc6234-5d79-4ec0-bd74-caff0dd67aa1 Page numbers 55-56 Event 13th International Workshop on Nanomechanical Sensing, 2016-06-22 → 2016-06-24, Delft, Netherlands Part of collection Institutional Repository Document type abstract Rights © 2016 A. Keyvani, H. Sadeghian, J.F.L. Goosen, A. van Keulen Files PDF Keyvani.pdf 603.59 KB Close viewer /islandora/object/uuid:13dc6234-5d79-4ec0-bd74-caff0dd67aa1/datastream/OBJ/view