Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images

Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images

Gonnissen, J.
De Backer, A.
Den Dekker, A.J.
Martinez, G.T.
Rosenauer, A.
Sijbers, J.
Van Aert, S.

Mechanical, Maritime and Materials Engineering

Delft Center for Systems and Control

2014-12-31

We report an innovative method to explore the optimal experimental settings to detect light atoms from scanning transmission electron microscopy (STEM) images. Since light elements play a key role in many technologically important materials, such as lithium-battery devices or hydrogen storage applications, much effort has been made to optimize the STEM technique in order to detect light elements. Therefore, classical performance criteria, such as contrast or signal-to-noise ratio, are often discussed hereby aiming at improvements of the direct visual interpretability. However, when images are interpreted quantitatively, one needs an alternative criterion, which we derive based on statistical detection theory. Using realistic simulations of technologically important materials, we demonstrate the benefits of the proposed method and compare the results with existing approaches.

http://resolver.tudelft.nl/uuid:1eff3468-73cc-4852-adea-80c145ca1902

https://doi.org/http://dx.doi.org/10.1063/1.4892884

American Institute of Physics (AIP)

0003-6951

Applied Physics Letters 105(6), 1-5. (2014)

Institutional Repository

journal article

(c) Gonnissen, J.
De Backer, A.
Den Dekker, A.J.
Martinez, G.T.
Rosenauer, A.
Sijbers, J.
Van Aert, S.