Method for sample preparation for cryoelectron microscopy (CEM) microreactor and loading platform

Title

Method for sample preparation for cryoelectron microscopy (CEM) microreactor and loading platform

 Author

Zandbergen, H.W.
Ahn, C.W.

Faculty

Applied Sciences

 Date

2008-01-24

 Abstract

A method for sample preparation for cryoelectron microscopy (CEM), wherein the sample is held in a microreactor, wherein the conditions in the microreactor are regulated relative to the environment, wherein the sample in the microreactor is frozen according to a quench freeze process, whereupon the sample, in frozen condition, is placed in the electron microscope. A microreactor for use with cryoelectron microscopy (CEM), comprising a first and second membrane, which membranes, at least in a condition of use, enclose a chamber, while the membranes are configured to last until at least the beginning of a quench freeze process.

 To reference this document use:

http://resolver.tudelft.nl/uuid:1fc63098-1d89-4c10-8614-98ed5df3619b

 Publisher

European Patent Office

 Source

WO 2008010718 (A2)

 Is part of

http://v3.espacenet.com/publicationDetails/biblio?adjacent=true&locale=en_EP&FT=D&date=20080124&CC=WO&NR=2008010718A2&KC=A2

 Part of collection

Institutional Repository

 Document type

patent

 Rights

(c) 2008 Zandbergen, H.W.; Ahn, C.W.
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