Print Email Facebook Twitter A scattering model for surface-textured thin films Title A scattering model for surface-textured thin films Author Jäger, K. Zeman, M. Faculty Electrical Engineering, Mathematics and Computer Science Department Electrical Sustainable Energy Date 2009-10-29 Abstract We present a mathematical model that relates the surface morphology of randomly surface-textured thin films with the intensity distribution of scattered light. The model is based on the first order Born approximation [see e.g., M. Born and E. Wolf, Principles of Optics, 7th ed. (Cambridge University Press, Cambridge, England, 1999) ] and on Fraunhofer scattering. Scattering data of four transparent conductive oxide films with different surface textures were used to validate the model and good agreement between the experimental and calculated intensity distribution was obtained. Subject aluminiumboronFraunhofer diffractionII-VI semiconductorssemiconductor thin filmssurface morphologywide band gap semiconductorszinc compounds To reference this document use: http://resolver.tudelft.nl/uuid:2135fefe-4449-46e6-bd99-4f37e38c4bbc DOI https://doi.org/10.1063/1.3254239 Publisher American Institute of Physics ISSN 0003-6951 Source http://link.aip.org/link/APPLAB/v95/i17/p171108/s1 Source Applied Physics Letters, 95 (17), 2009 Part of collection Institutional Repository Document type journal article Rights (c) 2009 The Author(s); American Institute of Physics Files PDF Jager_2009.pdf 150.6 KB Close viewer /islandora/object/uuid:2135fefe-4449-46e6-bd99-4f37e38c4bbc/datastream/OBJ/view