Measurement of the htickness and refractive index of evaporated dielectric films

Title

Measurement of the htickness and refractive index of evaporated dielectric films

Author

Van Vonno, W.

Contributor

De Lang, H. (promotor)

Faculty

Applied Sciences

Date

1968-05-08

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Publisher

Waltman

Part of collection

Institutional Repository

Document type

doctoral thesis

Rights

(c)1968 Van Vonno, W.