Characterization of Low-dimensional Structures by Advanced Transmission Electron Microscopy

Title

Characterization of Low-dimensional Structures by Advanced Transmission Electron Microscopy

 Author

Yücelen, E.

Contributor

Zandbergen, H.W. (promotor)

Faculty

Applied Sciences

 Department

Kavli Institute of Nanoscience Delft

 Date

2011-06-09

 Abstract

This thesis describes method development in TEM-related techniques and their application to the study of nanoprecipitates and low-dimensional structures. The work is divided into two parts. • The first part is focused on the structures of nanoprecipitates found in Al-Co, Al-Ni and Al-Fe-Zr alloys. • The second part describes the effect of accelerating voltage and its direct impact on image formation in different materials including the application of low acceleration voltages to the imaging of graphene single/double sheets quantitatively.

 Subject

Electron Microscopy
Electron Diffraction

 To reference this document use:

http://resolver.tudelft.nl/uuid:286a60a5-4daa-492c-8d6f-6ec7fe04ed74

 Publisher

Ipskamp Drukkers

 Embargo date

2011-06-08

 ISBN

9789491211645

 Part of collection

Institutional Repository

 Document type

doctoral thesis

 Rights

(c) 2011 Yücelen, E.
Files
PDF EYucelen_Thesis.pdf 11.92 MB
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