Print Email Facebook Twitter Optical degradation mechanisms and accelerated reliability evaluation for LEDs Title Optical degradation mechanisms and accelerated reliability evaluation for LEDs Author Huang, J. (TU Delft Electronic Components, Technology and Materials) Contributor Zhang, Kouchi (promotor) van Driel, W.D. (promotor) Degree granting institution Delft University of Technology Date 2016-09-19 To reference this document use: https://doi.org/10.4233/uuid:299c48c9-5bc7-4c5a-aab8-1b82696fbb5b ISBN 978-94-028-0296-2 Part of collection Institutional Repository Document type doctoral thesis Rights © 2016 J. Huang Files PDF dissertation.pdf 175.48 MB Close viewer /islandora/object/uuid:299c48c9-5bc7-4c5a-aab8-1b82696fbb5b/datastream/OBJ/view