Print Email Facebook Twitter Chaos Title Chaos: The speed limiting phenomenon in dynamic atomic force microscopy Author Keyvani Janbahan, A. (TU Delft Computational Design and Mechanics; TNO) Alijani, F. (TU Delft Dynamics of Micro and Nano Systems) Sadeghian, Hamed (Eindhoven University of Technology; TNO) Maturova, Klara (TNO) Goosen, J.F.L. (TU Delft Computational Design and Mechanics) van Keulen, A. (TU Delft Computational Design and Mechanics) Date 2017 Abstract This paper investigates the closed-loop dynamics of the Tapping Mode Atomic Force Microscopy using a new mathematical model based on the averaging method in Cartesian coordinates. Experimental and numerical observations show that the emergence of chaos in conventional tapping mode AFM strictly limits the imaging speed. We show that, if the controller of AFM is tuned to be faster than a certain threshold, the closed-loop system exhibits a chaotic behavior. The presence of chaos in the closed-loop dynamics is confirmed via bifurcation diagrams, Poincaré sections, and Lyapunov exponents. Unlike the previously detected chaos due to attractive forces in the AFM, which can be circumvented via simple changes in operation parameters, this newly identified chaos is seemingly inevitable and imposes an upper limit for the closed-loop bandwidth of the AFM. Subject Atomic force microscopyControl theoryPhase space methodsChaotic systemsAttractors To reference this document use: http://resolver.tudelft.nl/uuid:3a7fba78-86ec-4506-b3fe-c089c28b7c9c DOI https://doi.org/10.1063/1.5000130 Embargo date 2018-12-01 ISSN 0021-8979 Source Journal of Applied Physics, 122 (22) Part of collection Institutional Repository Document type journal article Rights © 2017 A. Keyvani Janbahan, F. Alijani, Hamed Sadeghian, Klara Maturova, J.F.L. Goosen, A. van Keulen Files PDF 1.5000130.pdf 6.65 MB Close viewer /islandora/object/uuid:3a7fba78-86ec-4506-b3fe-c089c28b7c9c/datastream/OBJ/view