Print Email Facebook Twitter Faster Defect Resolution with Higher Technical Quality of Software Title Faster Defect Resolution with Higher Technical Quality of Software Author Luijten, B. Visser, J. Faculty Electrical Engineering, Mathematics and Computer Science Department Software Technology Date 2010-12-31 Abstract We performed an empirical study of the relation between technical quality of software products and the defect resolution performance of their maintainers. In particular, we tested the hypothesis that ratings for source code maintainability, as employed by the SIG quality model, are correlated with ratings for defect resolution speed. This study revealed that all but one of the metrics of the SIG quality model show significant positive correlation Preprint accepted for publication in the proceedings of the 4th International Workshop on Software Quality and Maintainability (SQM 2010), Madrid (Spain) 15-18 March, 2010 Subject Software defectsDefect resolutionMaintainabilitySource code metricsRank correlationIssue tracker mining To reference this document use: http://resolver.tudelft.nl/uuid:4a631b42-59a4-47a8-a4ba-5fd2e7757534 Publisher Delft University of Technology, Software Engineering Research Group ISSN 1872-5392 Source Technical Report Series TUD-SERG-2010-006 Part of collection Institutional Repository Document type report Rights © 2010 The Author(s) . Software Engineering Research Group, Department of Software Technology, Faculty of Electrical Engineering, Mathematics and Computer Science, Delft University of Technology Files PDF TUD-SERG-2010-006.pdf 337.26 KB Close viewer /islandora/object/uuid:4a631b42-59a4-47a8-a4ba-5fd2e7757534/datastream/OBJ/view