Instrument for measuring a diffraction pattern of a specimen

Title

Instrument for measuring a diffraction pattern of a specimen

Author

Bottger, A.
Delhez, R.
Hendrikx, R.W.A.
Pers, N.M.

Faculty

Mechanical, Maritime and Materials Engineering

Department

Materials Science and Engineering

Date

2012-05-14

To reference this document use:

http://resolver.tudelft.nl/uuid:5265df83-f128-44c4-a146-ea6ea4c90a87

Publisher

European Patent Office

Source

http://worldwide.espacenet.com/publicationDetails/biblio?DB=EPODOC&II=15&ND=3&adjacent=true&locale=en_EP&FT=D&date=20120514&CC=NL&NR=2005661C&KC=C

Source

NL 2005661 (C)

Part of collection

Institutional Repository

Document type

patent

Rights

(c) 2012 The Author(s)