Print Email Facebook Twitter Cryo-CMOS Circuits and Systems for Quantum Computing Applications Title Cryo-CMOS Circuits and Systems for Quantum Computing Applications Author Patra, B (TU Delft OLD QCD/Charbon Lab) Incandela, R.M. (TU Delft OLD QCD/Charbon Lab) van Dijk, J.P.G. (TU Delft OLD QCD/Charbon Lab) Homulle, Harald (TU Delft OLD QCD/Charbon Lab) Song, Lin (Analog Devices Inc.) Shahmohammadi, M. (Catena) Staszewski, R.B. (TU Delft Electronics; University College Dublin) Vladimirescu, A. (TU Delft OLD QCD/Charbon Lab; University of California; Institut Supérieur d’Electronique de Paris,) Babaie, M. (TU Delft Electronics) Sebastiano, F. (TU Delft (OLD)Applied Quantum Architectures) Charbon-Iwasaki-Charbon, E. (TU Delft OLD QCD/Charbon Lab; TU Delft (OLD)Applied Quantum Architectures; Kavli institute of nanoscience Delft) Date 2018 Abstract A fault-tolerant quantum computer with millions of quantum bits (qubits) requires massive yet very precise control electronics for the manipulation and readout of individual qubits. CMOS operating at cryogenic temperatures down to 4 K (cryo-CMOS) allows for closer system integration, thus promising a scalable solution to enable future quantum computers. In this paper, a cryogenic control system is proposed, along with the required specifications, for the interface of the classical electronics with the quantum processor. To prove the advantages of such a system, the functionality of key circuit blocks is experimentally demonstrated. The characteristic properties of cryo-CMOS are exploited to design a noise-canceling low-noise amplifier for spin-qubit RF-reflectometry readout and a class-F2,3 digitally controlled oscillator required to manipulate the state of qubits. Subject class-F oscillatorCMOS characterizationcryo-CMOSlow-noise amplifier (LNA)noise cancelingphase noise (PN)quantum bit (qubit)quantum computingqubit controlSingle-photon avalanche diode (SPAD) To reference this document use: http://resolver.tudelft.nl/uuid:57a99994-50fe-4e98-8a9c-7d066645f715 DOI https://doi.org/10.1109/JSSC.2017.2737549 ISSN 0018-9200 Source IEEE Journal of Solid State Circuits, 53 (1), 309-321 Part of collection Institutional Repository Document type contribution to periodical Rights © 2018 B Patra, R.M. Incandela, J.P.G. van Dijk, Harald Homulle, Lin Song, M. Shahmohammadi, R.B. Staszewski, A. Vladimirescu, M. Babaie, F. Sebastiano, E. Charbon-Iwasaki-Charbon Files PDF 26955419_08036394.pdf 5.92 MB Close viewer /islandora/object/uuid:57a99994-50fe-4e98-8a9c-7d066645f715/datastream/OBJ/view