Print Email Facebook Twitter Outlook: From Physics of Failure to Physics of Degradation Title Outlook: From Physics of Failure to Physics of Degradation Author van Driel, W.D. (TU Delft Electronic Components, Technology and Materials) Yazdan Mehr, M. (TU Delft Electronic Components, Technology and Materials) Fan, X. J. (Lamar University) Zhang, Kouchi (TU Delft Electronic Components, Technology and Materials) Contributor van Driel, Willem Dirk (editor) Mehr, Maryam Yazdan (editor) Date 2022 Abstract In the foregoing chapters, the reliability of organic compounds in microelectronics and optoelectronics was discussed. It provided a state of the art in reliability concepts for materials used in electronic products. It also enlightened the direction in reliability concepts for these products. In this chapter, we discuss the outlook where we envision that physics of failure will be replaced by physics of degradation. New technologies, like health monitoring and digital twins, are needed to make this foreseen shift in reliability concepts. To reference this document use: http://resolver.tudelft.nl/uuid:5d6862d7-7459-40cb-9d8e-6f96aa54ac6e DOI https://doi.org/10.1007/978-3-030-81576-9_17 Publisher Springer Embargo date 2022-11-28 ISBN 978-3-030-81575-2 Source Reliability of Organic Compounds in Microelectronics and Optoelectronics: From Physics-of-Failure to Physics-of-Degradation Bibliographical note Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public. Part of collection Institutional Repository Document type book chapter Rights © 2022 W.D. van Driel, M. Yazdan Mehr, X. J. Fan, Kouchi Zhang Files PDF 978_3_030_81576_9_17.pdf 347.3 KB Close viewer /islandora/object/uuid:5d6862d7-7459-40cb-9d8e-6f96aa54ac6e/datastream/OBJ/view