Active Resonator Reset in the Nonlinear Dispersive Regime of Circuit QED

Active Resonator Reset in the Nonlinear Dispersive Regime of Circuit QED

Bultink, C.C. (TU Delft QCD/DiCarlo Lab; TU Delft QuTech Advanced Research Centre; Kavli institute of nanoscience Delft)
Rol, M.A. (TU Delft QCD/DiCarlo Lab; TU Delft QuTech Advanced Research Centre; Kavli institute of nanoscience Delft)
O'Brien, T.E. (Universiteit Leiden)
Fu, X. (TU Delft Computer Engineering; TU Delft QuTech Advanced Research Centre)
Dikken, B.C.S. (TU Delft QuTech Advanced Research Centre; Student TU Delft; Kavli institute of nanoscience Delft)
Dickel, C. (TU Delft QCD/DiCarlo Lab; TU Delft QuTech Advanced Research Centre; Kavli institute of nanoscience Delft)
Vermeulen, R.F.L. (TU Delft ALG/General; TU Delft QuTech Advanced Research Centre; Kavli institute of nanoscience Delft)
de Sterke, J.C. (TU Delft QCD/DiCarlo Lab; TU Delft QuTech Advanced Research Centre; Topic Embedded Systems B.V.)
Bruno, A. (TU Delft QCD/DiCarlo Lab; TU Delft QuTech Advanced Research Centre; Kavli institute of nanoscience Delft)
Schouten, R.N. (TU Delft ALG/General; TU Delft QuTech Advanced Research Centre; Kavli institute of nanoscience Delft)
DiCarlo, L. (TU Delft QCD/DiCarlo Lab; TU Delft QN/DiCarlo Lab; TU Delft QuTech Advanced Research Centre; Kavli institute of nanoscience Delft)

2016-09-13

We present two pulse schemes to actively deplete measurement photons from a readout resonator in the nonlinear dispersive regime of circuit QED. One method uses digital feedback conditioned on the measurement outcome, while the other is unconditional. In the absence of analytic forms and symmetries to exploit in this nonlinear regime, the depletion pulses are numerically optimized using the Powell method. We speed up photon depletion by more than six inverse resonator linewidths, saving approximately 1650 ns compared to depletion by waiting. We quantify the benefit by emulating an ancilla qubit performing repeated quantum-parity checks in a repetition code. Fast depletion increases the mean number of cycles to a spurious error detection event from order 1 to 75 at a 1-μs cycle time.

Electronics
Quantum Information

http://resolver.tudelft.nl/uuid:5f614893-de32-4be2-b7b2-55d5dba1ef01

https://doi.org/10.1103/PhysRevApplied.6.034008

2331-7019

Physical Review Applied, 6 (3), 1-10

Institutional Repository

journal article

© 2016 C.C. Bultink, M.A. Rol, T.E. O'Brien, X. Fu, B.C.S. Dikken, C. Dickel, R.F.L. Vermeulen, J.C. de Sterke, A. Bruno, R.N. Schouten, L. DiCarlo