Print Email Facebook Twitter Structured ultrasound microscopy Title Structured ultrasound microscopy Author Janjic, Jovana (Erasmus MC) Kruizinga, P. (Erasmus MC) van der Meulen, P.Q. (TU Delft Signal Processing Systems) Springeling, Geert (Erasmus MC) Mastik, Frits (Erasmus MC) Leus, G.J.T. (TU Delft Signal Processing Systems) Bosch, Johan G. (Erasmus MC) van der Steen, A.F.W. (TU Delft ImPhys/Acoustical Wavefield Imaging; Erasmus MC) van Soest, G. (Erasmus MC) Date 2018 Abstract We present a form of acoustic microscopy, called Structured Ultrasound Microscopy (SUM). It creates a volumetric image by recording reflected echoes of ultrasound waves with a structured phase front using a moving single-element transducer and computational reconstruction. A priori knowledge of the acoustic field produced by the single element allows us to relate the received echoes to a 3D scatter map within the acoustic beam itself, leading to an isotropic resolution at all depths. An aberration mask in front of the acoustic element imposes the phase structure, broadening the beam and breaking the spatial coherence between different voxels at equal acoustic propagation delay, increasing the uniqueness of the reconstruction. By translating the transducer across the 3D volume, we synthetically enlarge the imaging aperture by using multiple overlapping and spatially sparsely sampled measurements to solve for the entire image. In this paper, we explain the SUM technique and demonstrate microscopic imaging at 20 MHz of a 2.3 × 2.3 × 1.2 mm object in water, with an isotropic resolution below 100 μm. The proposed approach allows for wide-field 3D imaging at isotropic microscopic resolution using a small unfocused ultrasound sensor and multiple spatially sparsely sampled measurements. This technique may find applications in many other fields where space is constrained, device simplicity is desired, and wide-field isotropic high-resolution imaging is required. To reference this document use: http://resolver.tudelft.nl/uuid:6af108fb-ddb2-40ca-918e-78c0b1c43e20 DOI https://doi.org/10.1063/1.5026863 ISSN 0003-6951 Source Applied Physics Letters, 112 (25), 1-5 Part of collection Institutional Repository Document type journal article Rights © 2018 Jovana Janjic, P. Kruizinga, P.Q. van der Meulen, Geert Springeling, Frits Mastik, G.J.T. Leus, Johan G. Bosch, A.F.W. van der Steen, G. van Soest Files PDF 45584257_1.5026863.pdf 2.46 MB Close viewer /islandora/object/uuid:6af108fb-ddb2-40ca-918e-78c0b1c43e20/datastream/OBJ/view