Print Email Facebook Twitter Angular resolved scattering by a nano-textured ZnO/silicon interface Title Angular resolved scattering by a nano-textured ZnO/silicon interface Author Schulte, M. Bittkau, K. Jäger, K. Ermes, M. Zeman, M. Pieters, B.E. Faculty Electrical Engineering, Mathematics and Computer Science Department Electrical Sustainable Energy Date 2011-09-14 Abstract Textured interfaces in thin-film silicon solar cells improve the efficiency by light scattering. A technique to get experimental access to the angular intensity distribution (AID) at textured interfaces of the transparent conductive oxide (TCO) and silicon is introduced. Measurements are performed on a sample with polished microcrystalline silicon layer deposited onto a rough TCO layer. The AID determined from the experiment is used to validate the AID obtained by a rigorous solution of Maxwell’s equations. Furthermore, the applicability of other theoretical approaches based on scalar scattering theory and ray tracing is discussed with respect to the solution of Maxwell’s equations. Subject elemental semiconductorsII-VI semiconductorslight scatteringsolar cellszinc compounds To reference this document use: http://resolver.tudelft.nl/uuid:71e642a0-087c-49fc-b8f8-320d9e8739c1 DOI https://doi.org/10.1063/1.3640238 Publisher American Institute of Physics ISSN 0003-6951 Source http://link.aip.org/link/doi/10.1063/1.3640238 Source Applied Physics Letters, 99 (11), 2011 Part of collection Institutional Repository Document type journal article Rights © 2011 the Author(s)American Institute of Physics Files PDF Zeman_2011.pdf 374.73 KB Close viewer /islandora/object/uuid:71e642a0-087c-49fc-b8f8-320d9e8739c1/datastream/OBJ/view