Print Email Facebook Twitter Interfacial force measurements using atomic force microscopy Title Interfacial force measurements using atomic force microscopy Author Chu, L. (TU Delft OLD ChemE/Organic Materials and Interfaces) Contributor Sudhölter, Ernst J. R. (promotor) Picken, S.J. (promotor) Degree granting institution Delft University of Technology Date 2018-01-08 Abstract Atomic Force Microscopy (AFM) can not only image the topography of surfaces at atomic resolution, but can also measure accurately the different interaction forces, like repulsive, adhesive and lateral existing between an AFM tip and the sample surface. Based on AFM, various extended techniques have been developed such as colloidal probe AFM, single molecule AFM, bio-AFM, Kalvin probe AFM and lateral force AFM (LFM). Together,these make AFM a powerful tool to study the properties of surfaces and interfaces, which is of great importance for many different disciplines, e.g. surface chemistry, polymerchemistry and physics, solid-state physics, cell biology and medicine. Subject Atomic Force Microscopy (AFM)Force measurementsGraphene oxideSilica To reference this document use: https://doi.org/10.4233/uuid:a4771e84-1f87-483f-8fce-c119df35b171 ISBN 978-94-6332-297-3 Part of collection Institutional Repository Document type doctoral thesis Rights © 2018 L. Chu Files PDF Thesis_Liangyong_final_fo ... _12_11.pdf 7.16 MB Close viewer /islandora/object/uuid:a4771e84-1f87-483f-8fce-c119df35b171/datastream/OBJ/view