Print Email Facebook Twitter Reliability and Lifetime Prediction of Remote Phosphor Plates in Solid-State Lighting Applications Using Accelerated Degradation Testing Title Reliability and Lifetime Prediction of Remote Phosphor Plates in Solid-State Lighting Applications Using Accelerated Degradation Testing Author Yazdan Mehr, M. (TU Delft Electronic Components, Technology and Materials) van Driel, W.D. (TU Delft Electronic Components, Technology and Materials) Zhang, Kouchi (TU Delft Electronic Components, Technology and Materials) Date 2015-11-05 Abstract A methodology, based on accelerated degradation testing, is developed to predict the lifetime of remote phosphor plates used in solid-state lighting (SSL) applications. Both thermal stress and light intensity are used to accelerate degradation reaction in remote phosphor plates. A reliability model, based on the Eyring relationship, is also developed in which both acceleration factors (light intensity and temperature) are incorporated. Results show that the developed methodology leads to a significant decay of the luminous flux, correlated colour temperature (CCT) and chromatic properties of phosphor plates within a practically reasonable period of time. The combination of developed acceleration testing and a generalized Eyring equation-based reliability model is a very promising methodology which can be applied in the SSL industry. Subject LEDremote phosphorlight intensitythermal ageing To reference this document use: http://resolver.tudelft.nl/uuid:a4f23cb4-a2c7-4b8c-8f38-6885ab0ebefa DOI https://doi.org/10.1007/s11664-015-4120-y ISSN 0361-5235 Source Journal of Electronic Materials, 45 (1), 444-452 Part of collection Institutional Repository Document type journal article Rights © 2015 M. Yazdan Mehr, W.D. van Driel, Kouchi Zhang Files PDF 3233853.pdf 1.63 MB Close viewer /islandora/object/uuid:a4f23cb4-a2c7-4b8c-8f38-6885ab0ebefa/datastream/OBJ/view