Print Email Facebook Twitter Thermal Expansion and Aging Effects in Neuromorphic Signal Processor Title Thermal Expansion and Aging Effects in Neuromorphic Signal Processor Author Zjajo, Amir (TU Delft Signal Processing Systems) van Leuken, T.G.R.M. (TU Delft Signal Processing Systems) Date 2016-10-13 Abstract In this paper, we propose an efficient methodology based on a real-time estimator and predictor-corrector scheme for accurate thermal expansion profile and aging evaluation of a neuromorphic signal processor circuit components. As the experimental results indicate, for comparable mesh size, the proposed method is 1~2 order of magnitude more accurate than corresponding, generalized finite element method. Subject NeuromorphicsAgingThermal resistanceThermal expansionIntegrated circuit modelingFinite element analysisSemiconductor device modeling To reference this document use: http://resolver.tudelft.nl/uuid:a55401d4-de5a-40b1-9315-25e23b19084d DOI https://doi.org/10.1109/inec.2016.7589259 Publisher IEEE, Piscataway, NJ ISBN 978-1-4673-8969-3 Source 2016 IEEE International Nanoelectronics Conference (INEC) Event 2016 IEEE International Nanoelectronics Conference, 2016-05-09 → 2016-05-11, Chengdu, China Part of collection Institutional Repository Document type conference paper Rights © 2016 Amir Zjajo, T.G.R.M. van Leuken Files PDF zjajo2016thermal.pdf 430.86 KB Close viewer /islandora/object/uuid:a55401d4-de5a-40b1-9315-25e23b19084d/datastream/OBJ/view