Print Email Facebook Twitter In situ imaging of electromigration-induced nanogap formation by transmission electron microscopy Title In situ imaging of electromigration-induced nanogap formation by transmission electron microscopy Author Heersche, H.B. Lientschnig, G. O'Neill, K. Van der Zant, H.S.J. Zandbergen, H.W. Faculty Applied Sciences Department Kavli Institute of Nanoscience Date 2007-08-17 Abstract The authors imaged electromigration-induced nanogap formation in situ by transmission electron microscopy. Real-time video recordings show that edge voids form near the cathode side. The polycrystalline gold wires narrow down until a single-grain boundary intersects the constriction along which the breaking continues. During the last 50?ms of the break, a relatively large deformation of the constriction’s geometry occurs. The shape of the anode (blunt) and the cathode (sharp) is asymmetric when the wire breaks with a bias voltage applied, but symmetric when a narrow constriction breaks spontaneously. Subject electromigrationgoldgrain boundariesnanostructured materialstransmission electron microscopy To reference this document use: http://resolver.tudelft.nl/uuid:a8507bfe-5713-47c5-8ebc-29e00dce43cd DOI https://doi.org/10.1063/1.2767149 Publisher American Institute of Physics ISSN 0003-6951 Source http://link.aip.org/link/APPLAB/v91/i7/p072107/s1 Source Applied Physics Letters, 91 (7), 2007 Part of collection Institutional Repository Document type journal article Rights (c) 2007 The Author(s); American Institute of Physics Files PDF Heersche_2007.pdf 310.24 KB Close viewer /islandora/object/uuid:a8507bfe-5713-47c5-8ebc-29e00dce43cd/datastream/OBJ/view