Print Email Facebook Twitter Light control of the nanoscale phase separation in heteroepitaxial nickelates Title Light control of the nanoscale phase separation in heteroepitaxial nickelates Author Mattoni, G. (TU Delft QN/Caviglia Lab) Manca, N. (TU Delft QN/Caviglia Lab) Hadjimichael, M. (University College London (UCL)) Zubko, P. (University College London (UCL)) van der Torren, J.H. (Universiteit Leiden) Yin, C. (Universiteit Leiden) Catalano, S. (University of Geneva) Gibert, M. (University of Geneva) Maccherozzi, F. (Diamond Light Source) Liu, Y. (Diamond Light Source) Dhesi, S.S. (Diamond Light Source) Caviglia, A. (TU Delft QN/Caviglia Lab) Date 2018 Abstract Strongly correlated materials show unique solid-state phase transitions with rich nanoscale phenomenology that can be controlled by external stimuli. Particularly interesting is the case of light–matter interaction in the proximity of the metal–insulator transition of heteroepitaxial nickelates. In this work, we use near-infrared laser light in the high-intensity excitation regime to manipulate the nanoscale phase separation in NdNiO3. By tuning the laser intensity, we can reproducibly set the coverage of insulating nanodomains, which we image by photoemission electron microscopy, thus semipermanently configuring the material state. With the aid of transport measurements and finite element simulations, we identify two different timescales of thermal dynamics in the light–matter interaction: a steady-state and a fast transient local heating. These results open interesting perspectives for locally manipulating and reconfiguring electronic order at the nanoscale by optical means. Subject ConductivityCritical phenomenaFirst order phase transitionsMetal-insulator transitionMicrophase separationNucleationConductivityCritical phenomenaFirst order phase transitionsMetal-insulator transitionMicrophase separationHeterostructuresSingle crystal materialsStrongly correlated systemsterminal techniquesHigh-resolution electron microscopyPhotoexcitationX-ray absorption spectroscopyX-ray photoemission electron microscopy To reference this document use: http://resolver.tudelft.nl/uuid:aa85ded7-4fe1-4461-b81e-bb145d7f46a7 DOI https://doi.org/10.1103/PhysRevMaterials.2.085002 ISSN 2475-9953 Source Physical Review Materials, 2 (8) Part of collection Institutional Repository Document type journal article Rights © 2018 G. Mattoni, N. Manca, M. Hadjimichael, P. Zubko, J.H. van der Torren, C. Yin, S. Catalano, M. Gibert, F. Maccherozzi, Y. Liu, S.S. Dhesi, A. Caviglia Files PDF PhysRevMaterials.2.085002.pdf 908.34 KB Close viewer /islandora/object/uuid:aa85ded7-4fe1-4461-b81e-bb145d7f46a7/datastream/OBJ/view