Print Email Facebook Twitter Optical path difference microscopy with a Shack-Hartmann wavefront sensor Title Optical path difference microscopy with a Shack-Hartmann wavefront sensor Author Gong, H. (TU Delft Team Raf Van de Plas) Agbana, T.E. (TU Delft Team Raf Van de Plas) Pozzi, P. (TU Delft Team Raf Van de Plas) Soloviev, O.A. (TU Delft Team Raf Van de Plas; Flexible Optical B.V.; ITMO University) Verhaegen, M.H.G. (TU Delft Team Raf Van de Plas) Vdovin, Gleb (TU Delft Team Raf Van de Plas; Flexible Optical B.V.; ITMO University) Date 2017 Abstract In this Letter, we show that a Shack-Hartmann wavefront sensor can be used for the quantitative measurement of the specimen optical path difference (OPD) in an ordinary incoherent optical microscope, if the spatial coherence of the illumination light in the plane of the specimen is larger than the microscope resolution. To satisfy this condition, the illumination numerical aperture should be smaller than the numerical aperture of the imaging lens. This principle has been successfully applied to build a high-resolution reference-free instrument for the characterization of the OPD of micro-optical components and microscopic biological samples. To reference this document use: http://resolver.tudelft.nl/uuid:ac5abc3c-a8d6-4828-8b38-179dfb2c676b DOI https://doi.org/10.1364/OL.42.002122 ISSN 0146-9592 Source Optics Letters, 42 (11), 2122-2125 Part of collection Institutional Repository Document type journal article Rights © 2017 H. Gong, T.E. Agbana, P. Pozzi, O.A. Soloviev, M.H.G. Verhaegen, Gleb Vdovin Files PDF ol_42_11_2122.pdf 1.66 MB Close viewer /islandora/object/uuid:ac5abc3c-a8d6-4828-8b38-179dfb2c676b/datastream/OBJ/view