Print Email Facebook Twitter Nonlinear dynamics for estimating the tip radius in atomic force microscopy Title Nonlinear dynamics for estimating the tip radius in atomic force microscopy Author Rull Trinidad, E. (TU Delft Micro and Nano Engineering) Gribnau, T.W. Belardinelli, P. (TU Delft Dynamics of Micro and Nano Systems) Staufer, U. (TU Delft Micro and Nano Engineering) Alijani, F. (TU Delft Dynamics of Micro and Nano Systems) Date 2017 Abstract The accuracy of measurements in Amplitude Modulation Atomic Force Microscopy (AFM) is directly related to the geometry of the tip. The AFM tip is characterized by its radius of curvature, which could suffer from alterations due to repetitive mechanical contact with the surface. An estimation of the tip change would allow the user to assess the quality during imaging. In this work, we introduce a method for tip radius evaluation based on the nonlinear dynamic response of the AFM cantilever. A nonlinear fitting procedure is used to match several curves with softening nonlinearity in the noncontact regime. By performing measurements in this regime, we are able to maximize the influence of the tip radius on the AFM probe response, and this can be exploited to estimate with good accuracy the AFM tip radius. Subject Atomic force microscopyNonlinear dynamicsIntermolecular forcesVan der Waals forcesEquipment and apparatus To reference this document use: http://resolver.tudelft.nl/uuid:adf56cdb-84be-4f38-b8fc-fad3e04acad9 DOI https://doi.org/10.1063/1.4991471 Embargo date 2018-09-21 ISSN 0003-6951 Source Applied Physics Letters, 111 (12) Part of collection Institutional Repository Document type journal article Rights © 2017 E. Rull Trinidad, T.W. Gribnau, P. Belardinelli, U. Staufer, F. Alijani Files PDF 1.4991471.pdf 784.34 KB Close viewer /islandora/object/uuid:adf56cdb-84be-4f38-b8fc-fad3e04acad9/datastream/OBJ/view