In situ TEM electrical measurements of semiconductor and metal nanowires

Title

In situ TEM electrical measurements of semiconductor and metal nanowires

Author

Neklyudova, M. (TU Delft QN/Zandbergen Lab)

Contributor

Zandbergen, H.W. (promotor)

Degree granting institution

Delft University of Technology

Date

2016-07-05

To reference this document use:

https://doi.org/10.4233/uuid:b3696080-152a-4f00-9be7-4eb139c05ab4

ISBN

9789085932567

Part of collection

Institutional Repository

Document type

doctoral thesis

Rights

© 2016 M. Neklyudova