Dielectric Response of Corn Leaves to Water Stress

Dielectric Response of Corn Leaves to Water Stress

van Emmerik, T.H.M. (TU Delft Water Resources)
Steele-Dunne, S.C. (TU Delft Water Resources)
Judge, J (University of Florida)
van de Giesen, N.C. (TU Delft Water Resources)

2016

Radar backscatter from vegetated surface is sensitive to direct backscatter from the canopy, and two-way attenuation of the signal as it travels through the canopy. Both mechanisms are affected by the dielectric properties of {the individual elements of the canopy, which are primarily a function of water content.} Leaf water content of corn can change considerably during the day and in response to water stress, and model simulations suggested that this significantly affects radar backscatter. Understanding the influence of water stress on leaf dielectric properties will give insight into how the plant water status changes in response to water stress, and how radar can be used to detect vegetation water stress. We used a microstrip line resonator to monitor the changes its resonant frequency at corn leaves, due to variations in dielectric properties. This study presents in vivo resonant frequency measurements during field experiments with and without water stress, to understand the dielectric response due to stress. The resonant frequency of the leaf around the main leaf of the stressed plant showed increasing diurnal differences. The dielectric response of the unstressed plant remained stable. This study shows the clear statistically significant effect of water stress on variations in resonant frequency at individual leaves.

Radar
Hydrology
Water stress
Dielectric constant
Maize
Vegetation

http://resolver.tudelft.nl/uuid:bb21352d-a1e0-4c16-9efc-68cff8999793

https://doi.org/10.1109/LGRS.2016.2606662

1545-598X

IEEE Geoscience and Remote Sensing Letters, 14 (1), 8-12

Institutional Repository

journal article

© 2016 T.H.M. van Emmerik, S.C. Steele-Dunne, J Judge, N.C. van de Giesen