Print Email Facebook Twitter A compact 12-bit DAC and output buffer in 40nm for built-in self-test Title A compact 12-bit DAC and output buffer in 40nm for built-in self-test Author Chen, Yikun (TU Delft Electrical Engineering, Mathematics and Computer Science) Contributor Makinwa, Kofi (mentor) Degree granting institution Delft University of Technology Date 2017-11-17 Subject DACCMOSanalog circuit design To reference this document use: http://resolver.tudelft.nl/uuid:bd25e3b5-e693-4cdc-b576-bb56d6281af7 Embargo date 2020-11-17 Part of collection Student theses Document type master thesis Rights © 2017 Yikun Chen Files PDF main.pdf 60.76 MB Close viewer /islandora/object/uuid:bd25e3b5-e693-4cdc-b576-bb56d6281af7/datastream/OBJ/view