Testing multi-port memories: Theory and practice

Title

Testing multi-port memories: Theory and practice

Author

Hamdioui, S.

Contributor

Van de Goor, A.J. (promotor)

Faculty

Electrical Engineering, Mathematics and Computer Science

Date

2001-10-01

Subject

Single-port SRAMs
multi-port SRAMs
fault modeling
circuit simulation
inductive fault analysis
memory testing
march tests
fault coverage
test strategy

To reference this document use:

http://resolver.tudelft.nl/uuid:ccced323-46dd-4557-aaf5-dee4840b31fe

ISBN

90-9014986-4

Part of collection

Institutional Repository

Document type

doctoral thesis

Rights

(c) 2001 S. Hamdioui