Print Email Facebook Twitter Quantitative coating thickness determination using a coefficient-independent hyperspectral scattering model Title Quantitative coating thickness determination using a coefficient-independent hyperspectral scattering model Author Dingemans, LM Papadakis, V. (TU Delft Structural Integrity & Composites) Liu, P. (TU Delft Structural Integrity & Composites) Adam, A.J.L. (TU Delft ImPhys/Optics) Groves, R.M. (TU Delft Structural Integrity & Composites) Date 2017-12-20 Abstract BackgroundHyperspectral imaging is a technique that enables the mapping of spectral signatures across a surface. It is most commonly used for surface chemical mapping in fields as diverse as satellite remote sensing, biomedical imaging and heritage science. Existing models, such as the Kubelka-Munk theory and the Lambert-Beer law also relate layer thickness with absorption, and in the case of the Kubelka-Munk theory scattering, however they are not able to fully describe the complex behavior of the light-layer interaction.MethodsThis paper describes a new approach for hyperspectral imaging, the mapping of coating surface thickness using a coefficient-independent scattering model. The approach taken in this paper is to model the absorption and scattering behavior using a developed coefficient-independent model, calibrated using reference sample thickness measurements performed with optical coherence tomography.ResultsThe results show that this new model, by considering the spectral variation that can be recorded by the hyperspectral imaging camera, is able to measure coatings of 250 μm thickness with an accuracy of 11 μm in a fast and repeatable way.ConclusionsThe new coefficient-independent scattering model presented can successfully measure the thickness of coatings from hyperspectral imaging data. Subject AbsorptionScatteringCoating thickness measurementHyperspectral imagingQuantitative imagingOA-Fund TU Delft To reference this document use: http://resolver.tudelft.nl/uuid:ce9392fd-e3ad-4010-aeb3-b810600c4b87 DOI https://doi.org/10.1186/s41476-017-0068-2 ISSN 1990-2573 Source Journal of the European Optical Society - Rapid Publications, 13, 1-12 Part of collection Institutional Repository Document type journal article Rights © 2017 LM Dingemans, V. Papadakis, P. Liu, A.J.L. Adam, R.M. Groves Files PDF s41476_017_0068_2.pdf 1.76 MB Close viewer /islandora/object/uuid:ce9392fd-e3ad-4010-aeb3-b810600c4b87/datastream/OBJ/view