Print Email Facebook Twitter Multi-anode linear SDDs for high-resolution X-ray spectroscopy Title Multi-anode linear SDDs for high-resolution X-ray spectroscopy Author Sonsky, J. Contributor Van Eijk, C.W.E. (promotor) Faculty Interfaculty Reactor Institute Date 2002-06-07 Abstract Radiation detectors are used in a variety of fields to sense X-rays and y-rays, visible, UV and IR photons, neutrons or charged particles. With their help, advanced medical diagnostics can be performed (e.g. X-ray radiography, computed tomography, fluoroscopy), material research can undergo a rapid development (e.g. X-ray microanalysis, X-ray diffraction, Mauer spectroscopy and element imaging), space and its evolution (astronomy and astrophysics) can be explored through observation of X-rays and y-rays emitted by astronomical objects, etc. Semiconductor detectors, with silicon being the leading material, are used in many of the abovementioned applications. This thesis describes the development of a special type of silicon detector for 1D-position sensitive X-ray spectroscopy; the multi-anode silicon drift detector (SDD). The developed prototype is an ideal candidate for X-ray diffraction applications. Moreover, due to a high flexibility of its design, SDDs can be utilized in many other applications where sensing of X-rays in the range from 200 eV to 20 keV with an ultimate energy resolution is needed, e.g. X-ray fluorescence spectroscopy, X-ray holography and synchrotron experiments. Subject position-sensitive detectorX-ray spectroscopyelectron cloud confinementsilicon detector processinglow temperature processingp-JFET integration To reference this document use: http://resolver.tudelft.nl/uuid:d34fc1a6-9afb-4d18-a322-b1b943710b82 Publisher Delft University Press ISBN 90-407-2304-4 Part of collection Institutional Repository Document type doctoral thesis Rights (c) 2002 J. Sonsky Files PDF iri_sonsky_20020607.pdf 9.63 MB Close viewer /islandora/object/uuid:d34fc1a6-9afb-4d18-a322-b1b943710b82/datastream/OBJ/view