Print Email Facebook Twitter Imaging of charge trapping in distorted carbon nanotubes by x-ray excited scanning probe microscopy Title Imaging of charge trapping in distorted carbon nanotubes by x-ray excited scanning probe microscopy Author Ishii, M. Hamilton, B. Poolton, N. Faculty Applied Sciences Date 2008-11-25 Abstract We have observed the distribution of electron trapping centers on distorted carbon nanotubes (CNTs) by a unique x-ray analysis technique that has both elemental and spatial selectivities. This technique involves the use of scanning probe microscopy (SPM) under synchrotron radiation excitation of the inner shell of carbon. The probe detects the Coulomb force that results from the relaxation of an electron bound to a defect site into the core hole state created by x-ray photon absorption. This results in a change in charge state of the defect. At the spatial resolution provided by the SPM technique, we observed the electron trapping centers distributed on the compressed and torsionally distorted CNTs. This direct association of mechanical distortion with defect sites indicates a potential risk of deterioration of electric properties during the fabrication and processing of CNT networks. Subject atomic force microscopycarbon nanotubeselectron trapsnanotechnologyX-ray analysisX-ray microscopy To reference this document use: http://resolver.tudelft.nl/uuid:d577fef6-9c53-4674-a22f-22354ed7cf0c DOI https://doi.org/10.1063/1.3029725 Publisher American Institute of Physics ISSN 0021-8979 Source http://link.aip.org/link/JAPIAU/v104/i10/p103535/s1 Source Journal of Applied Physics, 104 (10), 2008 Part of collection Institutional Repository Document type journal article Rights (c) 2008 The Author(s); American Institute of Physics Files PDF Poolton_2008.pdf 618.7 KB Close viewer /islandora/object/uuid:d577fef6-9c53-4674-a22f-22354ed7cf0c/datastream/OBJ/view