Drift-Diffusion-Reaction Model for Time-Domain Analysis of Charging Phenomena in Electron-Beam Irradiated Insulators

Title

Drift-Diffusion-Reaction Model for Time-Domain Analysis of Charging Phenomena in Electron-Beam Irradiated Insulators

 Author

Raftari Tangabi, Behrouz (TU Delft Numerical Analysis)

Contributor

Vuik, Cornelis (promotor) ORCID 0000-0002-5988-9153
Budko, N.V. (copromotor) ORCID 0000-0002-9649-7386

 Degree granting institution

Delft University of Technology

 Date

2018-10-23

 Abstract

Electron microscopes take advantage of a beam of electrons to illuminate a
specimen and extract the needed information from the interaction of particles
with matter in order to produce a high resolution image. The main research
question of the present study arose from the fact that this resolution is degraded
when a given specimen contains insulating materials. In the electron
microscopy of insulators the effect behind the degradation of an image resolution
is known as the charging effect. The charging effect needs to be studied
and understood, in particular, since biological specimens are either insulators
or contain insulating parts.

 To reference this document use:

https://doi.org/10.4233/uuid:d823ad12-60ea-49d0-b8c0-0ccd1449387f

 ISBN

978-94-6186-960-9

 Part of collection

Institutional Repository

 Document type

doctoral thesis

 Rights

© 2018 Behrouz Raftari Tangabi
Files
PDF dissertation.pdf 2.24 MB
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