Print Email Facebook Twitter On the origin of amplitude reduction mechanism in tapping mode atomic force microscopy Title On the origin of amplitude reduction mechanism in tapping mode atomic force microscopy Author Keyvani Janbahan, A. (TU Delft Computational Design and Mechanics; TNO) Sadeghian, Hamed (TNO; Eindhoven University of Technology) Goosen, J.F.L. (TU Delft Computational Design and Mechanics) van Keulen, A. (TU Delft Computational Design and Mechanics) Date 2018 Abstract The origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typically attributed to the shift in resonance frequency of the cantilever due to the nonlinear tip-sample interactions. In this paper, we present a different insight into the same problem which, besides explaining the amplitude reduction mechanism, provides a simple reasoning for the relationship between tip-sample interactions and operation parameters (amplitude and frequency). The proposed formulation, which attributes the amplitude reduction to an interference between the tip-sample and dither force, only deals with the linear part of the system; however, it fully agrees with experimental results and numerical solutions of the full nonlinear model of TM-AFM. Subject Continuum mechanicsIntermolecular forcesNewtonian mechanicsAtomic force microscopyFourier analysisNanopatterningNonlinear dynamics To reference this document use: http://resolver.tudelft.nl/uuid:dd63017e-f364-4107-adad-f5b62187812c DOI https://doi.org/10.1063/1.5016306 Embargo date 2019-04-20 ISSN 0003-6951 Source Applied Physics Letters, 112 (16) Part of collection Institutional Repository Document type journal article Rights © 2018 A. Keyvani Janbahan, Hamed Sadeghian, J.F.L. Goosen, A. van Keulen Files PDF 1.5016306.pdf 1.11 MB Close viewer /islandora/object/uuid:dd63017e-f364-4107-adad-f5b62187812c/datastream/OBJ/view