Print Email Facebook Twitter Reliability and Failures in Solid State Lighting Systems Title Reliability and Failures in Solid State Lighting Systems Author van Driel, W.D. (TU Delft Electronic Components, Technology and Materials) Jacobs, B.M.M. (TU Delft Externenregistratie) Onushkin, G. (Signify) Watte, P. (Signify) ZHAO, X. (TU Delft Mechanical Engineering) Davis, J. Lynn (RTI International) Contributor van Driel, Willem Dirk (editor) Mehr, Maryam Yazdan Mehr (editor) Faculty Mechanical Engineering Date 2022 Abstract Reliability is an essential scientific and technological domain intrinsically linked with system integration. Nowadays, semiconductor industries are confronted with ever-increasing design complexity, dramatically decreasing design margins, increasing chances for and consequences of failures, shortening of product development and qualification time, and increasing difficulties to meet quality, robustness, and reliability requirements. The scientific successes of many micro/nano-related technology developments cannot lead to business success without innovation and breakthroughs in the way that we address reliability through the whole value chain. The aim of reliability is to predict, optimize, and design upfront the reliability of micro/nanoelectronics and systems, an area denoted as “Design for Reliability (DfR)”. While virtual schemes based on numerical simulation are widely used for functional design, they lack a systematic approach when used for reliability assessments. Besides this, lifetime predictions are still based on old standards assuming a constant failure rate behavior. In this chapter, we will present the reliability and failures found in solid-state lighting systems. It includes both degradation and catastrophic failure modes from observation toward a full description of its mechanism obtained by extensive use of acceleration tests using knowledge-based qualification methods. To reference this document use: http://resolver.tudelft.nl/uuid:df3685d4-6f06-44c3-9c13-5a03dfee4bcb DOI https://doi.org/10.1007/978-3-030-81576-9_7 Publisher Springer Embargo date 2022-11-28 ISBN 978-3-030-81575-2 Source Reliability of Organic Compounds in Microelectronics and Optoelectronics: From Physics-of-Failure to Physics-of-Degradation Part of collection Institutional Repository Document type book chapter Rights © 2022 W.D. van Driel, B.M.M. Jacobs, G. Onushkin, P. Watte, X. ZHAO, J. Lynn Davis Files PDF 978_3_030_81576_9_7.pdf 1.7 MB Close viewer /islandora/object/uuid:df3685d4-6f06-44c3-9c13-5a03dfee4bcb/datastream/OBJ/view