Print Email Facebook Twitter Reliability and Lifetime Prediction of Remote Phosphor Plates in Solid-State Lighting Applications Using Accelerated Degradation Testing Title Reliability and Lifetime Prediction of Remote Phosphor Plates in Solid-State Lighting Applications Using Accelerated Degradation Testing Author Yazdan Mehr, M. Van Driel, W.D. Zhang, G.Q. Faculty Electrical Engineering, Mathematics and Computer Science Department Microelectronics Date 2015-11-05 Abstract A methodology, based on accelerated degradation testing, is developed to predict the lifetime of remote phosphor plates used in solid-state lighting (SSL) applications. Both thermal stress and light intensity are used to accelerate degradation reaction in remote phosphor plates. A reliability model, based on the Eyring relationship, is also developed in which both acceleration factors (light intensity and temperature) are incorporated. Results show that the developed methodology leads to a significant decay of the luminous flux, correlated colour temperature (CCT) and chromatic properties of phosphor plates within a practically reasonable period of time. The combination of developed acceleration testing and a generalized Eyring equation-based reliability model is a very promising methodology which can be applied in the SSL industry. Subject LEDremote phosphorlight intensitythermal ageing To reference this document use: http://resolver.tudelft.nl/uuid:e3f17eea-7364-4e89-bf20-9c0b09e4006f Publisher Springer ISSN 0361-5235 Source https://doi.org/10.1007/s11664-015-4120-y Source Journal of Electronic Materials, 2015 Part of collection Institutional Repository Document type journal article Rights (c) 2015 The Author(s)This article is published with open access at Springerlink.com Files PDF Zhang_2015.pdf 1.42 MB Close viewer /islandora/object/uuid:e3f17eea-7364-4e89-bf20-9c0b09e4006f/datastream/OBJ/view