Print Email Facebook Twitter Improving Quality of Electron Microscopic Images Using Post-Processing Filters Title Improving Quality of Electron Microscopic Images Using Post-Processing Filters Author Arikan, S. Contributor Heynderickx, I. (mentor) Faculty Electrical Engineering, Mathematics and Computer Science Department Mediamatics Date 2009-08-26 Abstract Electron microscopy makes it possible to magnify samples at almost atom level by using electron beams to scan the sample. These images could be improved in terms of noise and sharpness. In this research we looked into the possibilities to use post-processing filters for improving the quality of electron microscopic images. Subject electron microscopyelectron microscopescanning electron microscopeSEMimage qualitypost-processingimage processingbilateral filterdeconvolutiondenoisingsharpening To reference this document use: http://resolver.tudelft.nl/uuid:e5fb890e-4446-4367-80b5-e4b7768f36d3 Part of collection Student theses Document type master thesis Rights (c) 2009 Arikan, S. Files PDF master_thesis_serkan_arikan.pdf 2.5 MB Close viewer /islandora/object/uuid:e5fb890e-4446-4367-80b5-e4b7768f36d3/datastream/OBJ/view