Print Email Facebook Twitter Characterization of standard cell libraries in cryogenic applications Title Characterization of standard cell libraries in cryogenic applications Author Kroep, Kees (TU Delft Electrical Engineering, Mathematics and Computer Science) Contributor Charbon, Edoardo (mentor) Degree granting institution Delft University of Technology Programme Computer Engineering Date 2018-12-17 Abstract In order to improve the ability to design digital ICs for cryogenic temperatures, the objective of this work is to characterize the timing performance of standard cells in the TSMC 40nm technology at a temperature range between 4K and 300K. A design was made to perform automated on-chip characterization of standard cell propagation delay, that makes use of random sampling. An ASIC was implemented and fabricated based on this design. A test setup was designed and build to perform the characterization. Besides that a design for a scalable gray-counter was developed and implemented that promises excellent performance for power critical applications. Subject CharacterizationCryo-CMOSCryogenicgraycounterPropagation delay To reference this document use: http://resolver.tudelft.nl/uuid:e707343f-8f4c-4fa9-8a70-b8a46a5fa8fb Part of collection Student theses Document type master thesis Rights © 2018 Kees Kroep Files PDF mscThesis_h.j.c.Kroep.pdf 31.6 MB Close viewer /islandora/object/uuid:e707343f-8f4c-4fa9-8a70-b8a46a5fa8fb/datastream/OBJ/view