Print Email Facebook Twitter A probabilistic physics-of-failure reliability assessment approach for integrated LED lamps Title A probabilistic physics-of-failure reliability assessment approach for integrated LED lamps Author Sun, B. (Guangdong University of Technology) Fan, J. (Hohai University) Fan, Xuejun (Lamar University) Zhang, Kouchi (TU Delft Electronic Components, Technology and Materials) Date 2018 Abstract This work studies the effect of randomness of LED's lumen depreciation on reliability of the entire LED lamp. An integrated LED light bulb is selected as carrier of the proposed method. A PoF based lumen depreciation model and electronic-thermal simulations are introduced for reliability prediction. The normal distribution is used to describe the statistical distribution of LEDs. The probabilities of the driver's catastrophic failures and lumen can then be obtained by Monte Carlo simulations by considering the increase of lamp's temperature. The effect of the lumen depreciation to the entire lamp is studied with two scenarios: constant light mode and constant current mode. Subject ReliabilityJunctionsLED lampsLight sourcesTemperature distributionIntegrated circuit modeling To reference this document use: http://resolver.tudelft.nl/uuid:e941d5e3-f213-42f6-b997-18a824518e57 DOI https://doi.org/10.1109/EuroSimE.2018.8369897 Publisher IEEE, Piscataway, NJ ISBN 978-1-5386-2359-6 Source 2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018 Event EuroSimE 2018, 2018-04-15 → 2018-04-18, Toulouse, France Bibliographical note Accepted author manuscript Part of collection Institutional Repository Document type conference paper Rights © 2018 B. Sun, J. Fan, Xuejun Fan, Kouchi Zhang Files PDF 51127845_2018_EuroSime_Full.pdf 536.07 KB Close viewer /islandora/object/uuid:e941d5e3-f213-42f6-b997-18a824518e57/datastream/OBJ/view