Print Email Facebook Twitter Stress analysis of pressure-assisted sintering for the double-side assembly of power module Title Stress analysis of pressure-assisted sintering for the double-side assembly of power module Author Liu, Y. (TU Delft Electronic Components, Technology and Materials; Harbin University of Science and Technology) Zhang, H. (TU Delft Electronic Components, Technology and Materials; Harbin University of Science and Technology) Wang, Lingen (Boschman Technologies) Fan, Xuejun (Lamar University) Zhang, Kouchi (TU Delft Electronic Components, Technology and Materials) Sun, Fenglian (Harbin University of Science and Technology) Date 2019 Abstract Purpose: Crack and stress distribution on dies are key issues for the pressure-assisted sintering bonding of power modules. The purpose of this research is to build a relationship among stress distributions, sintering sequences and sintering pressures during the sintering processes. Design/methodology/approach: Three sintering sequences, S(a), S(b) and S(c), have been designed for the double-side assembly of power module in this paper. Experiments and finite element method (FEM) analysis are conducted to investigate the crack and stress distribution. Findings: The sintering sequence had significant effects on the crack generation in the chips during the sintering process under 30-MPa pressure. The simulation results revealed that the module sintered by S(a) showed lower chip stress than those by the other two sintering sequences under 30 MPa. In contrast, the chip stress is the highest when the sintering sequence follows S(b). The simulation results explained the crack generation and prolongation in the experiments. S(a) was recommended as the best sintering sequence because of the lowest chip stress and highest yield rate. Originality/value: This study investigated the stress distributions of the double-side sintered power modules under different sintering pressures. Based on the results of experiments and FEM analysis, the best sintering sequence design is provided under various sintering pressures. Subject Double-side assemblyPower chipReliabilitySintering To reference this document use: http://resolver.tudelft.nl/uuid:ea241a32-56c8-4623-8ea9-762c7022f76a DOI https://doi.org/10.1108/SSMT-01-2018-0005 ISSN 0954-0911 Source Soldering and Surface Mount Technology, 31 (1), 1-8 Bibliographical note Accepted author manuscript Part of collection Institutional Repository Document type journal article Rights © 2019 Y. Liu, H. Zhang, Lingen Wang, Xuejun Fan, Kouchi Zhang, Fenglian Sun Files PDF 5_50629640_Stress_Analysi ... Module.pdf 1.37 MB Close viewer /islandora/object/uuid:ea241a32-56c8-4623-8ea9-762c7022f76a/datastream/OBJ/view