A quick method to determine the capacitance characteristics of thin layer X5R multilayer capacitors
article
The effect of Y2O3 concentration on the dielectric properties of ceramic disc capacitors and multilayer capacitors containing 50 dielectric layers with an approximate thickness of 3µm were investigated. The relative permittivity and temperature coefficient of capacity of multilayer capacitors at low and high applied field suggest that two types of microstructures formed, depending on yttrium doping concentration. Yttrium concentrations of 1.5-2.0mol% yielded identical relative permittivities over a wide temperature range. The permittivities at Y concentrations of 2.6-3.0mol% were also identical, but somewhat higher. The relative permittivity of ceramic disc capacitors of similar composition, determined from hysteresis loop measurements as function of applied field, was compared with field-dependent permittivity measurements on multilayer capacitors. The results indicate that polarization measurements on CDCs are a good indicator for the relative permittivity values of MLCCs. © 2011 Elsevier Ltd.
Topics
BaTiO3CapacitorsDielectric propertiesHysteresis loopY2O3Applied fieldBaTiO3Capacitance characteristicsCeramic discsDielectric layerField-dependent permittivityHysteresis loop measurementsMultilayer capacitorsPolarization measurementsRelative permittivityTemperature coefficientTemperature rangeThin layersYttrium dopingBarium titanateCeramic materialsHysteresisMultilayersPermittivityPermittivity measurementYttriumYttrium alloysCapacitors
TNO Identifier
442921
ISSN
09552219
Source
Journal of the European Ceramic Society, 32(1), pp. 167-173.
Collation
7 p.
Pages
167-173
Files
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