Print Email Facebook Twitter Arrangement and method for accommodating a sample in an electron microscope Title Arrangement and method for accommodating a sample in an electron microscope Author Zandbergen, H.W. Date 1996 Abstract Abstract of NL 9402226 (A) The invention relates to an arrangement for accommodating a sample in an electron microscope, equipped with a sample holder which comprises sample accommodation means and is designed for at least partial accommodation in an electron microscope, where at least one sample mount is provided which can contain a sample in a position in which the sample is at least partially visible from the outside of the sample mount from at least two sides opposite one another, the or each sample mount being capable of being accommodated in the sample accommodation means. The invention further relates to a method for accommodating a sample in an electron microscope. To reference this document use: http://resolver.tudelft.nl/uuid:ff48b88a-c03f-4b2b-8eb1-c4e94da019b7 Publisher European Patent Office Is part of http://v3.espacenet.com/publicationDetails/biblio?adjacent=true&KC=A&date=19960801&NR=9402226A&DB=EPODOC&locale=en_EP&CC=NL&FT=D Part of collection Institutional Repository Document type patent Rights (c) Delft University of Technology Files PDF NL9402226A.pdf 643.36 KB Close viewer /islandora/object/uuid:ff48b88a-c03f-4b2b-8eb1-c4e94da019b7/datastream/OBJ/view