Prediction of Lumen Depreciation and Color Shift for Phosphor-Converted White Light-Emitting Diodes Based on A Spectral Power Distribution Analysis Method

Qian, Cheng; Fan, Jiajie; Fan, Xuejun; Zhang, Kouchi

doi:10.1109/ACCESS.2017.2716354

Prediction of Lumen Depreciation and Color Shift for Phosphor-Converted White Light-Emitting Diodes Based on A Spectral Power Distribution Analysis Method

Title

Prediction of Lumen Depreciation and Color Shift for Phosphor-Converted White Light-Emitting Diodes Based on A Spectral Power Distribution Analysis Method

Author

Qian, Cheng (Chinese Academy of Sciences; Changzhou Institute of Technology Research for Solid State Lighting)
Fan, Jiajie (Hohai University; Beijing Research Center; Changzhou Institute of Technology Research for Solid State Lighting)
Fan, Xuejun (Lamar University; Changzhou Institute of Technology Research for Solid State Lighting)
Zhang, Kouchi (TU Delft Electronic Components, Technology and Materials; Chinese Academy of Sciences)

Date

2017

Abstract

The spectral power distribution (SPD) is considered as the figureprint of a light emitting diode (LED). Based on the analysis on its SPD, a method to predict both lumen depreciation and color shift for the phosphor converted white LEDs (pc-LEDs) is proposed in this paper. First, the entire SPD of a pc-LED is predicted by superimposing two asymmetric double sigmoidal (Asym2sig) models, which represent the decomposed blue light and phosphor converted light peaks, respectively. For a better understanding of how the SPD model affects the photometric and colorimetric characteristics of a pc-LED, a sensitivity study of the SPD parameters is then performed on its luminous flux Φ, color coordinates CIE1976( u′, v′). Second, the evolutionary process of the SPD is predicted for a pc-LED with the color temperature as 3000 K under degradation testing. And based on these predicted SPDs, the drift curves of Φ, u′, v′, and du′ v′are further predicted. Finally, lifetimes of the pc-LED due to lumen depreciation and color shift are estimated simultaneously from the predicted Φ and du′ v′ drift curves.

Subject

Light emitting diodes
prediction methods
semiconductor device reliability
spectral analysis

To reference this document use:

http://resolver.tudelft.nl/uuid:19823cdb-2603-485a-bc51-e9c8edfd9ceb

DOI

https://doi.org/10.1109/ACCESS.2017.2716354

ISSN

2169-3536

Source

IEEE Access, 5, 24054-24061

Part of collection

Institutional Repository