Print Email Facebook Twitter Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures Title Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures Author Adam, A.J.L. Brok, J.M. Seo, M.A. Ahn, K.J. Kim, D.S. Kang, J.H. Park, Q.H. Nagel, M. Planken, P.C.M. Faculty Applied Sciences Department Imaging Science and Technology Date 2008-05-06 Abstract Using terahertz-light excitation, we have measured with sub-wavelength spatial, and sub-cycle temporal resolution the time- and frequency-dependent electric-field and surface-charge density in the vicinity of small metallic holes. In addition to a singularity like concentration of the electric field near the hole edges, we observe, that holes can act as differential operators whose near-field output is the time-derivative of the incident electric field. Our results confirm the well-known predictions made by Bouwkamp, Philips Res. Rep. 5, 321-332 (1950), and reveal, with unprecedented detail, what physically happens when light passes through a small hole. Subject aperturesnear-field microscopyspectroscopyteraherz To reference this document use: http://resolver.tudelft.nl/uuid:22e25de6-b248-43e9-a8fc-a5be54f46969 DOI https://doi.org/10.1364/OE.16.007407 Publisher Optical Society of America ISSN 1094-4087 Source http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-10-7407 Source Optics Express, 16 (10), 2008 Part of collection Institutional Repository Document type journal article Rights (c) 2008 Optical Society of America Files PDF Adam2008.pdf 1.28 MB Close viewer /islandora/object/uuid:22e25de6-b248-43e9-a8fc-a5be54f46969/datastream/OBJ/view