Print Email Facebook Twitter Structural and electrical properties of metastable defects in hydrogenated amorphous silicon Title Structural and electrical properties of metastable defects in hydrogenated amorphous silicon Author Melskens, J. Schnegg, A. Baldansuren, A. Lips, K. Plokker, M.P. Eijt, S.W.H. Schut, H. Fischer, M. Zeman, M. Smets, A.H.M. Faculty Applied Sciences Date 2015-06-11 Abstract The structural and electrical properties of metastable defects in various types of hydrogenated amorphous silicon have been studied using a powerful combination of continuous wave electron-paramagnetic resonance spectroscopy, electron spin echo (ESE) decay measurements, and Doppler broadening positron annihilation spectroscopy. The observed dependence of the paramagnetic defect density on the Doppler S parameter indicates that porous, nanosized void-rich materials exhibit higher spin densities, while dense, divacancy-dominated materials show smaller spin densities. However, after light soaking more similar spin densities are observed, indicating a long-term defect creation process in the Staebler-Wronski effect that does not depend on the a-Si:H nanostructure. From ESE decays it appears that there are fast and slowly relaxing defect types, which are linked to various defect configurations in small and large open volume deficiencies. A nanoscopic model for the creation of light-induced defects in the a-Si:H nanostructure is proposed. To reference this document use: http://resolver.tudelft.nl/uuid:2a54c9f0-a848-4dc7-8982-9570b7a85523 Publisher American Physical Society ISSN 1098-0121 Source https://doi.org/10.1103/PhysRevB.91.245207 Source Physical Review, 91, 2015 Part of collection Institutional Repository Document type journal article Rights © 2015 American Physical Society Files PDF Smets_2015.pdf 393.91 KB Close viewer /islandora/object/uuid:2a54c9f0-a848-4dc7-8982-9570b7a85523/datastream/OBJ/view