A Reliability Prediction Methodology for LED Arrays

Sun, B.; Fan, J.; Fan, Xuejun; Zhang, Kouchi; Zhang, Guohao

doi:10.1109/ACCESS.2018.2887252

A Reliability Prediction Methodology for LED Arrays

Title

A Reliability Prediction Methodology for LED Arrays

Author

Sun, B. (Guangdong University of Technology)
Fan, J. (Hohai University)
Fan, Xuejun (Lamar University)
Zhang, Kouchi (TU Delft Electronic Components, Technology and Materials)
Zhang, Guohao (Guangdong University of Technology)

Date

2019

Abstract

In this paper, a physics of failure-based prediction method is combined with statistical models to consider the impact of current crowding and current droop effects on the reliability of LED arrays. Electronic-thermal models of LEDs are utilized to obtain the operation conditions under the influences of current crowding and current droop. A Markov chain-based model is used to calculate the probability distribution of each failure mode, including the lumen decay and catastrophic failure. Two types of LEDs were selected for a numerical study. The proposed prediction method provides the realistic reliability prediction results. It is found that the properties of LEDs have a great impact on their hazard rates of LED arrays. The equivalent resistance, third-order non-radiative coefficient, and radiative coefficient of LEDs are critical to the reliability of an LED array.

Subject

Catastrophic failure
electronic-thermal model
LED array
Markov chain
reliability prediction

To reference this document use:

http://resolver.tudelft.nl/uuid:76847a92-d407-4a8e-b26d-4660282134a5

DOI

https://doi.org/10.1109/ACCESS.2018.2887252

ISSN

2169-3536

Source

IEEE Access, 7, 8127-8134

Part of collection

Institutional Repository