Alpha particle spectroscopy using FNTD and SIM super-resolution microscopy

Alpha particle spectroscopy using FNTD and SIM super-resolution microscopy

Kouwenberg, J.J.M. (TU Delft RST/Applied Radiation & Isotopes)
Kremers, G. J. (Erasmus MC)
Slotman, J. A. (Erasmus MC)
Wolterbeek, H.T. (TU Delft RST/Radiation, Science and Technology)
Houtsmuller, A.B. (TU Delft Education and Student Affairs; Erasmus MC)
Denkova, A.G. (TU Delft RST/Applied Radiation & Isotopes)
bos, A.J.J. (TU Delft RST/Fundamental Aspects of Materials and Energy)

RST/Radiation, Science and Technology

2018

Structured illumination microscopy (SIM) for the imaging of alpha particle tracks in fluorescent nuclear track detectors (FNTD) was evaluated and compared to confocal laser scanning microscopy (CLSM). FNTDs were irradiated with an external alpha source and imaged using both methodologies. SIM imaging resulted in improved resolution, without increase in scan time. Alpha particle energy estimation based on the track length, direction and intensity produced results in good agreement with the expected alpha particle energy distribution. A pronounced difference was seen in the spatial scattering of alpha particles in the detectors, where SIM showed an almost 50% reduction compared to CLSM. The improved resolution of SIM allows for more detailed studies of the tracks induced by ionising particles. The combination of SIM and FNTDs for alpha radiation paves the way for affordable and fast alpha spectroscopy and dosimetry. Journal compilation

Alpha radiation
FNTD
SIM

http://resolver.tudelft.nl/uuid:968d73da-423e-4799-b6c5-024dd50fde77

https://doi.org/10.1111/jmi.12686

0022-2720

Journal of Microscopy, 270 (3), 326-334

Institutional Repository

journal article

© 2018 J.J.M. Kouwenberg, G. J. Kremers, J. A. Slotman, H.T. Wolterbeek, A.B. Houtsmuller, A.G. Denkova, A.J.J. bos