Print Email Facebook Twitter Axial-resolution in depth from focus digital holography Title Axial-resolution in depth from focus digital holography Author van Rooij, J. (TU Delft ImPhys/Quantitative Imaging) Kalkman, J. (TU Delft ImPhys/Quantitative Imaging) Contributor Kress, Bernard C. (editor) Osten, Wolfgang (editor) Urbach, H. Paul (editor) Date 2017 Abstract We use digital holography to quantify surface topography of rough objects in full-field. We calculate the variance of the intensity image as a focus metric over a set of reconstruction distances for each pixel, which results in a focus metric curve. The distance where the variance peaks is an estimate for the depth. First we analyze the lateral resolution of this method using the Talbot effect and argue that sub-mm axial resolution is feasible. Then, using a Michelson setup without magnifying optics or lateral scanning we experimentally demonstrate that sub-mm FWHM width of the focus curve can be achieved. This is significantly better than what was previously reported using digital holography and could make this technique useful for characterising objects in art and machine vision. Subject Digital holographymetrologyTalbot effectdepth from focus To reference this document use: http://resolver.tudelft.nl/uuid:b37ac3df-c086-4a8c-8700-cf1554c48786 DOI https://doi.org/10.1117/12.2270295 Publisher SPIE ISBN 978-1-5106-1115-3 Source Digital Optical Technologies 2017 Event SPIE Digital Optical Technologies 2017, 2017-06-25 → 2017-06-29, Internationales Congress Center Munich, Munich, Germany Series Proceedings of SPIE, 1605-7422, 10335 Part of collection Institutional Repository Document type conference paper Rights © 2017 J. van Rooij, J. Kalkman Files PDF 103351F.pdf 390.24 KB Close viewer /islandora/object/uuid:b37ac3df-c086-4a8c-8700-cf1554c48786/datastream/OBJ/view