Print Email Facebook Twitter Coulomb interactions in sharp tip pulsed photo field emitters Title Coulomb interactions in sharp tip pulsed photo field emitters Author Cook, B.J. (TU Delft ImPhys/Charged Particle Optics) Kruit, P. (TU Delft ImPhys/Charged Particle Optics) Date 2016-10-10 Abstract Photofield emitters show great potential for many single electron pulsed applications. However, for the brightest pulses > 10 11 A / (m 2 sr V), our simulations show that Poisson statistics and stochastic Coulomb interactions limit the brightness and increase the energy spread even with an average of a single electron per pulse. For the systems, we study we find that the energy spread is probably the limiting factor for most applications. Subject Field emittersPoisson's equationBrightnessField emissionSchottky barriers To reference this document use: http://resolver.tudelft.nl/uuid:b562d6ef-b678-41c9-8b60-22607fb85579 DOI https://doi.org/10.1063/1.4963783 ISSN 0003-6951 Source Applied Physics Letters, 109 (15) Part of collection Institutional Repository Document type journal article Rights © 2016 B.J. Cook, P. Kruit Files PDF 1.4963783.pdf 896.13 KB Close viewer /islandora/object/uuid:b562d6ef-b678-41c9-8b60-22607fb85579/datastream/OBJ/view