Specimen holder for an electron microscope, and method for reducing thermal drift in a microscope

Title

Specimen holder for an electron microscope, and method for reducing thermal drift in a microscope

 Author

Zandbergen, H.W.

Faculty

Applied Sciences

 Date

2004-03-18

 Abstract

A specimen holder for an electron microscope, comprising a rod-shaped part, which is provided near one end with a tip, which tip is arranged to receive a specimen, the rod-shaped part, in use, extending with at least the tip into the electron microscope, held by clamping means present in the electron microscope, wherein first temperature control means are provided to control the temperature of the rod-shaped part and/or the clamping means, such that this rod-shaped part and the clamping means substantially have the same temperature, at least at the location of their contact surfaces.

 To reference this document use:

http://resolver.tudelft.nl/uuid:b84e0ba1-d846-4b80-a63a-b0e28ab6c492

 Publisher

European Patent Office

 Source

WO 2004023514 (A1)

 Is part of

http://v3.espacenet.com/publicationDetails/biblio?CC=WO&NR=2004023514A1&KC=A1&FT=D&date=20040318&DB=&locale=en_EP

 Part of collection

Institutional Repository

 Document type

patent

 Rights

(c) 2004 Zandbergen, H.W.
Files
PDF WO2004023514A1.pdf 846.61 KB
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