Change analysis in structural laser scanning point clouds: The baseline method

Shen, Y.; Lindenbergh, R.C.; Wang, J.

doi:10.3390/s17010026

Change analysis in structural laser scanning point clouds

Title

Change analysis in structural laser scanning point clouds: The baseline method

Author

Shen, Y. (TU Delft Optical and Laser Remote Sensing; Hohai University)
Lindenbergh, R.C. (TU Delft Optical and Laser Remote Sensing)
Wang, J. (TU Delft Optical and Laser Remote Sensing; Chinese Academy of Sciences)

Date

2017-01-01

Abstract

A method is introduced for detecting changes from point clouds that avoids registration. For many applications, changes are detected between two scans of the same scene obtained at different times. Traditionally, these scans are aligned to a common coordinate system having the disadvantage that this registration step introduces additional errors. In addition, registration requires stable targets or features. To avoid these issues, we propose a change detection method based on so-called baselines. Baselines connect feature points within one scan. To analyze changes, baselines connecting corresponding points in two scans are compared. As feature points either targets or virtual points corresponding to some reconstructable feature in the scene are used. The new method is implemented on two scans sampling a masonry laboratory building before and after seismic testing, that resulted in damages in the order of several centimeters. The centres of the bricks of the laboratory building are automatically extracted to serve as virtual points. Baselines connecting virtual points and/or target points are extracted and compared with respect to a suitable structural coordinate system. Changes detected from the baseline analysis are compared to a traditional cloud to cloud change analysis demonstrating the potential of the new method for structural analysis.

Subject

Baselines
Change detection
Masonry buildings
Structural analysis
Terrestrial laser scanning
OA-Fund TU Delft

To reference this document use:

http://resolver.tudelft.nl/uuid:c39c50e1-a823-454f-a1f5-ecb10426afb7

DOI

https://doi.org/10.3390/s17010026

ISSN

1424-8220

Source

Sensors, 17 (1)

Part of collection

Institutional Repository